Fundamental principles, interaction of electrons with solids, basic designs including scanning electron microscope (SEM), transmission electron microscope (TEM), energy dispersive X-ray analysis. The advantages and disadvantages of different types of electron microscopes. Instrument setups and calibration. Sample preparation and operational modes, image analysis and signal processing. X-ray analysis, wavelength and energy dispersive spectrometers and X-ray mapping. -- Course Website
Prerequisites: 8142 (v.4)<br/> Physics 201<br/> <br/> or any previous version<br/> <br/> <br/><br/> <br/> AND<br/><br/> <br/> <br/> 312508 (v.1)<br/> Waves and Oscillations 202<br/> <br/> or any previous version<br/> <br/> <br/><br/> <br/> OR<br/><br/> <br/> <